多传感器坐标测量机的校准及应用

位恒政; 王为农; 裴丽梅; 郭斯宜; 崔剑秋; 向思思

doi:10.12338/j.issn.2096-9015.2023.0289

多传感器坐标测量机的校准及应用

doi: 10.12338/j.issn.2096-9015.2023.0289

1.
中国计量科学研究院，北京 100029

基金项目: 中国计量科学研究院基本科研业务费（YZC1401-14）。

详细信息

作者简介:
位恒政（1978-），中国计量科学研究院副研究员，研究方向：螺纹计量技术和坐标计量技术，邮箱：weihz@nim.ac.cn

中图分类号: TB921
计量
- 文章访问数: 111
- HTML全文浏览量: 42
- PDF下载量: 19
- 被引次数: 0
出版历程
- 收稿日期: 2023-11-18
- 录用日期: 2023-12-22
- 修回日期: 2023-12-25
- 网络出版日期: 2023-12-28
- 刊出日期: 2024-02-18

Calibration and Applications of Multi-Sensor Coordinate Measuring Machines

1.
National Institute of Metrology, Beijing 100029, China

摘要

摘要: 多传感器坐标测量机通过组合不同类型的传感器，可以快速地得到更全面、准确的测量数据，成为解决复杂物体测量的重要手段。多传感坐标测量机校准需要考虑单个传感器的计量特征和组合特性，介绍了国内外相关方法，中国计量科学研究院开展了基于多传感器坐标技术的摄影测量用靶标、硬度压头参数等应用研究，开发了光机两用标准器，实现了影像传感器和接触式传感器组合测量系统的精度评价。最后探讨了多传感器坐标测量技术一些有待研究的问题。
- 计量学 /
- 多传感器 /
- 坐标测量机 /
- 数据融合
Abstract: Multi-sensor Coordinate Measuring Machines (CMM) are becoming increasingly crucial in complex object measurements within advanced manufacturing, leveraging the combination of different sensor types to rapidly acquire comprehensive and accurate data. Calibration of multi-sensor CMMs necessitates consideration of individual sensors' metrological characteristics and their collective features. This paper reviews relevant domestic and international methods and discusses research conducted by the National Institute of Metrology of China. The institute has explored applications in photogrammetric targets and hardness indenter parameters using multi-sensor coordinate technology, developed an optical-mechanical dual-purpose standard, and evaluated the accuracy of combined measurement systems integrating image and contact sensors. Finally, the paper identifies several unresolved issues in multi-sensor coordinate measurement technology.
- metrology /
- multi-sensor /
- coordinate measuring machine /
- data fusion

HTML全文

图 1 Werth坐标测量机的传感器部分

Figure 1. Sensors on Werth coordinate measurement machine

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图 2 HEXAGON 坐标测量机的传感器部分

Figure 2. Sensors on HEXAGON coordinate measurement machine

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图 3 多探测系统测量标准球示意图

注：1为接触式传感器；2为光学距离传感器；3为影像传感器；4为接触传感器测量点；5为制造商指明的光学距离传感器的测量区域：标准球上球冠位置 0°到α；6为影像传感器的测量点，在标准器球的赤道处的XY平面内。

Figure 3. Schematic of multi-probe system measuring a standard sphere

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图 4 摄影测量用靶标

Figure 4. Photogrammetry retro-reflector target

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图 5 标准器示意图

Figure 5. Schematic diagram of the designed artifact

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图 6 标准器参数

Figure 6. Parameters of the designed artifact

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图 7 薄环规标准器测量实验装置图

Figure 7. Experiment setup for thin ring gauge artifact measurement

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图 8 点测量模式

Figure 8. Point measurement mode

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图 9 扫描测量模式

Figure 9. Scanning measurement mode

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图 10 洛氏硬度压头测量实验装置图

Figure 10. Experimental setup for geometrical measurement of the Rockwell diamond indenter

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图 11 硬度压头点云数据图

Figure 11. Point cloud data of the Rockwell Diamond Indenter

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图 12 硬度压头参数图

Figure 12. Illustration of the geometries of the Rockwell diamond indenter

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图 13 硬度压头同轴度参数

Figure 13. Coaxiality parameters of the Rockwell diamond indenter

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