Development of a Pure Manganese Flake Reference Material for Manganese Content Calibration in X-ray Energy/Wave Dispersive Spectrometers

TIAN Donghui; SHEN Yanfei; WANG Zhigang; CHEN Yaling; HU Gang; ZHOU Zhou; PU Cheng; LIU Ping; LIU Wenjun; SHI Yunxiao; LI Xu

doi:10.12338/j.issn.2096-9015.2024.0053

Volume 68 Issue 9

Aug. 2024

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Article Navigation > Metrology Science and Technology > 2024 > 68(9): 51-60

TIAN Donghui, SHEN Yanfei, WANG Zhigang, CHEN Yaling, HU Gang, ZHOU Zhou, PU Cheng, LIU Ping, LIU Wenjun, SHI Yunxiao, LI Xu. Development of a Pure Manganese Flake Reference Material for Manganese Content Calibration in X-ray Energy/Wave Dispersive Spectrometers[J]. Metrology Science and Technology, 2024, 68(9): 51-60. doi: 10.12338/j.issn.2096-9015.2024.0053

Citation:

TIAN Donghui, SHEN Yanfei, WANG Zhigang, CHEN Yaling, HU Gang, ZHOU Zhou, PU Cheng, LIU Ping, LIU Wenjun, SHI Yunxiao, LI Xu. Development of a Pure Manganese Flake Reference Material for Manganese Content Calibration in X-ray Energy/Wave Dispersive Spectrometers[J]. Metrology Science and Technology, 2024, 68(9): 51-60. doi: 10.12338/j.issn.2096-9015.2024.0053

Citation:

TIAN Donghui, SHEN Yanfei, WANG Zhigang, CHEN Yaling, HU Gang, ZHOU Zhou, PU Cheng, LIU Ping, LIU Wenjun, SHI Yunxiao, LI Xu. Development of a Pure Manganese Flake Reference Material for Manganese Content Calibration in X-ray Energy/Wave Dispersive Spectrometers[J]. Metrology Science and Technology, 2024, 68(9): 51-60. doi: 10.12338/j.issn.2096-9015.2024.0053

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Development of a Pure Manganese Flake Reference Material for Manganese Content Calibration in X-ray Energy/Wave Dispersive Spectrometers

doi: 10.12338/j.issn.2096-9015.2024.0053

TIAN Donghui^1
,,
SHEN Yanfei²,
WANG Zhigang¹,
CHEN Yaling^{2, 3, 4},
HU Gang⁵,
ZHOU Zhou^{2, 4},
PU Cheng¹,
LIU Ping²,
LIU Wenjun²,
SHI Yunxiao²,
LI Xu^{1, 2
,
,}

1.
National Institute of Metrology, Beijing 100029, China
2.
Meishan CRRC Brake Science & Technology Co., Ltd., Meishan 620010, China
3.
Hunan University of Chinese Medicine, Changsha 410208, China
4.
Zhuzhou Times New Material Technology Co., Ltd., Zhuzhou 412007, China
5.
Xiaoling Middle School of Chongyang County, Xianning 437000, China

Received Date: 2024-02-26
Accepted Date: 2024-05-09
Rev Recd Date: 2024-07-04

Available Online: 2024-07-09

Publish Date: 2024-09-18

Abstract

Abstract

A reference material of pure manganese flake for manganese content calibration in X-ray energy/wavelength dispersive spectrometers (EDS/WDS) was developed. The homogeneity and stability of manganese content in the pure manganese flake were examined using electron probe microanalysis (EPMA). The manganese content (mass fraction, %) of the reference material was determined using inductively coupled plasma optical emission spectrometry (ICP-OES) and inductively coupled plasma mass spectrometry (ICP-MS). The uncertainties of the reference material were evaluated. The results show that the pure manganese flake reference material exhibits good homogeneity and stability in manganese content. The certified value of manganese content in the reference material is 99.48% with an expanded uncertainty of 0.92% (k=2). The developed pure manganese flake reference material for EDS/WDS calibration can meet the calibration requirements of EDS/WDS and provide technical support for manganese element analysis in scientific research and industry in China.
- metrology,
- manganese,
- X-Ray energy/wave spectrometer,
- reference material,
- calibration,
- uncertainty

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References(25)

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