Nonuniform Frequency Sampling Technique for Near-Field Scattering Measurements

SI Weikang; WANG Weilong

doi:10.12338/j.issn.2096-9015.2024.0066

Volume 68 Issue 8

Aug. 2024

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SI Weikang, WANG Weilong. Nonuniform Frequency Sampling Technique for Near-Field Scattering Measurements[J]. Metrology Science and Technology, 2024, 68(8): 71-77, 17. doi: 10.12338/j.issn.2096-9015.2024.0066

Citation:

SI Weikang, WANG Weilong. Nonuniform Frequency Sampling Technique for Near-Field Scattering Measurements[J]. Metrology Science and Technology, 2024, 68(8): 71-77, 17. doi: 10.12338/j.issn.2096-9015.2024.0066

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Nonuniform Frequency Sampling Technique for Near-Field Scattering Measurements

doi: 10.12338/j.issn.2096-9015.2024.0066

SI Weikang,
WANG Weilong^,

National Institute of Metrology, Beijing 100029, China

Received Date: 2024-03-04
Accepted Date: 2024-03-18
Rev Recd Date: 2024-03-18

Available Online: 2024-05-28

Publish Date: 2024-08-30

Abstract

Abstract

Traditional stepped frequency (SF) systems synthesize a large measurement bandwidth using a series of equidistant discrete frequency signals. However, due to sampling theorem limitations, time-domain signals corresponding to fixed frequency intervals exhibit periodicity. Consequently, background and multipath interference in the measurement environment may alias into the target area, adversely affecting imaging and scattering measurements. This paper explores rapid measurement methods for frequency-stepped systems and proposes a near-field scattering measurement technique based on nonuniform sampling. We analyze the impact of range ambiguity on scattering measurements and design optimization principles for the sampling function based on practical application requirements. The signal envelope is shaped using Poisson's formula and the principle of stationary phase (POSP). To address scattering image degradation caused by traditional nonuniform sampling reconstruction methods, we propose a weighted method compatible with the nonuniform sampling strategy. This method effectively suppresses aliasing interference, achieves high-resolution imaging, and improves the accuracy of near-field to far-field (NF-FF) transformations.
- metrology,
- range ambiguity,
- scattering measurements,
- nonuniform sampling,
- near-field imaging,
- near-field to far-field transformation

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References(32)

References

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