Volume 68 Issue 5
May  2024
Turn off MathJax
Article Contents
YANG Yan, HUANG Lu, WANG Wei, DAI Dongxue, CHEN Yan, LU Wenjun, LU Zuliang. Research and Establishment of a New Impedance Traceability System Based on the New Calculable Capacitor Primary Standard[J]. Metrology Science and Technology, 2024, 68(5): 77-82, 109. doi: 10.12338/j.issn.2096-9015.2024.0070
Citation: YANG Yan, HUANG Lu, WANG Wei, DAI Dongxue, CHEN Yan, LU Wenjun, LU Zuliang. Research and Establishment of a New Impedance Traceability System Based on the New Calculable Capacitor Primary Standard[J]. Metrology Science and Technology, 2024, 68(5): 77-82, 109. doi: 10.12338/j.issn.2096-9015.2024.0070

Research and Establishment of a New Impedance Traceability System Based on the New Calculable Capacitor Primary Standard

doi: 10.12338/j.issn.2096-9015.2024.0070
  • Received Date: 2024-03-06
  • Accepted Date: 2024-04-07
  • Rev Recd Date: 2024-04-07
  • Available Online: 2024-05-17
  • Publish Date: 2024-05-18
  • Supported by the National Science and Technology Support Program and the National Key R&D Program, the National Institute of Metrology, China (NIM), has undertaken research and established a new AC impedance traceability system based on the new generation calculable capacitor. This includes the creation of new primary standards for capacitance and inductance, as well as AC resistance standards. The new systems have enabled the precise realization of the capacitance unit "Farad" and the inductance unit "Henry", enhancing the traceability capabilities for dissipation factor standard, capacitance working standard, inductance working standard, and AC resistance standard. This work has also included revising the calibration systems for capacitance, inductance, and dissipation factor measuring instruments, as well as updating regulations and specifications for standard capacitors, standard inductors, AC resistors, capacitor boxes, inductance boxes, and AC resistance boxes. As a result, a new AC impedance traceability system for China, based on the new generation calculable capacitor, has been established.
  • loading
  • [1]
    A. M. Thompson, D. G. Lampard. A new theorem in electrostatics and its application to calculable standards of capacitance[J]. Nature, 1956, 177: 888.
    [2]
    陆祖良, 黄璐, 杨雁, 等. 可移动屏蔽型计算电容研究[J]. 电测与仪表, 2013, 50(575): 23 − 28. doi: 10.3969/j.issn.1001-1390.2013.11.006
    [3]
    BIPM. Resolution 1, the 26th General Conference on Weights and Measures[Z].https://www.Bipm.org/utils/common/pdf/CGPM-2018/26th-CGPM-Resolutions.pdf.
    [4]
    邵海明, 张江涛, 黄璐. 新国际单位制对电磁计量体系的影响[J]. 计量学报, 2024, 45(2): 145 − 149.
    [5]
    BIPM. SI Brochure–9th edition (2019)–Appendix 2, Mise en pratique for the definition of the ampere and other electric units in the SI[Z].https://www.bipm.org/documents/20126/41489676/SI-App2-ampere.pdf.
    [6]
    Keller, M. W. Metrology triangle using a Watt balance, a calculable capacitor and a single-electron tunnelling device[J]. Metrologia, 2008, 45(3): 330. doi: 10.1088/0026-1394/45/3/010
    [7]
    杨雁, 黄璐, 王维, 等. NIM新一代二端对电容电桥装置[J]. 计量学报, 2020, 41(3): 284 − 289. doi: 10.3969/j.issn.1000-1158.2020.03.03
    [8]
    Y. YANG, L. Huang. Experiments on Linking the von Klitzing Constant and the Farad at NIM[C]. Denver: CPEM 2020 Conf. Diges, 2020.
    [9]
    Z. L. Lu, L. Huang, Y. Yang, et al. An initial reproduction of SI capacitance unit from a new calculable capacitor at NIM[J]. IEEE Trans Instrum Meas, 2015, 64(6): 1496 − 1502. doi: 10.1109/TIM.2015.2399012
    [10]
    Huang L , Yang Y , Lu Z , et al. Practical Application of Latest Optimal Hollow Active Auxiliary Electrode in Vertical Calculable Cross-Capacitor at NIM[J]. IEEE Transactions on Instrumentation and Measurement, 2019, 68(6): 2144 − 2150.
    [11]
    黄璐, 杨雁, 陆祖良, 等. 采用电补偿方案的新一代立式计算电容装置[J]. 计量学报, 2020, 41(3): 279 − 283. doi: 10.3969/j.issn.1000-1158.2020.03.02
    [12]
    Gournay P, Rolland B, Chayramy R, et al. Comparison CCEM-K4.2017 of 10 pF and 100 pF capacitance standards[J]. Metrologia, 2019, 56(1A): 01001. doi: 10.1088/0026-1394/56/1A/01001
    [13]
    陆文骏. 我国的国家电感基准[J]. 现代计量测试, 1995(3): 41 − 44.
    [14]
    Y. Yang, Q. Lu, L. Huang, et al. Determining the influence of Time Constants in Maxwell Bridge[C]. Rio de Janeiro : CPEM 2014 Conf. Digest, 2014.
    [15]
    白天, 王书涛, 杨雁, 等. 四端对同轴型计算电阻及其量值传递的研究[J]. 仪器仪表学报, 2022, 43(2): 84 − 91.
    [16]
    Huang L, Yang Y, Bai T, et al. The dissemination system of AC resistance at NIM[C]. Wellington: CPEM 2022 Conf. Digest, 2022.
    [17]
    X. He, D. Dai. Improvement on primary standard of dissipation factor at NIM[C]. Daejeon: CPEM 2010 Conf. Digest, 2010.
    [18]
    D. Dai, Y. Li. Bilateral Comparison of High-Voltage Capacitance and Dielectric Dissipation Factor at 50 Hz[J]. IEEE Transactions on Instrumentation and Measurement, 2023, 72: 1 − 8.
    [19]
    戴冬雪, 阮永顺, 王晓超, 等. 四端对固体介质电容器容量的扩展频段计量[J]. 上海交通大学学报, 2007, 41(3): 479 − 487. doi: 10.3321/j.issn:1006-2467.2007.03.030
    [20]
    D. Dai, X. He. Improvement of High-Value Capacitance Measurement[J]. IEEE Transactions on Instrumentation and Measurement, 2013, 62(6): 1795 − 1800.
    [21]
    周天地, 贾正森, 杨雁, 等. 基于PJVS的交流量子电压比例研究[J]. 仪器仪表学报, 2020(2): 85 − 92.
    [22]
    谷静, 杨雁, 陆青, 等. 基于数字比例技术的高精度交流电桥研究[J]. 仪器仪表学报, 2020(7): 29 − 37.
    [23]
    I. Robinson1, J. Belliss. Key comparison CCEM-K7: AC voltage ratio[J]. Metrologia, 2012, 49(1A): 01007. doi: 10.1088/0026-1394/49/1A/01007
    [24]
    Wang W , Yang Y , Huang L , et al. Establishing of a 1000 V Multi-decade Inductive Voltage Divider Standard at NIM[J]. IEEE Access, 2018, 99: 1.
    [25]
    X. HE, W. Wang. Resarch on High Accuracy Current Comparator and Self-Calibration Methods[J]. IEEE Trans. Instrum. Meas., 2013, 62(6): 1669 − 1674. doi: 10.1109/TIM.2013.2253978
  • 加载中

Catalog

    通讯作者: 陈斌, bchen63@163.com
    • 1. 

      沈阳化工大学材料科学与工程学院 沈阳 110142

    1. 本站搜索
    2. 百度学术搜索
    3. 万方数据库搜索
    4. CNKI搜索

    Figures(6)

    Article Metrics

    Article views (114) PDF downloads(11) Cited by()
    Proportional views
    Related

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return