Citation: | ZHAO Danhua, CHEN Jiarui, BAO Luwei, ZHU Jiahui. A Review of Electric Field Measurement and Microwave Sensing Based on Rydberg Atomic Apertures[J]. Metrology Science and Technology, 2024, 68(8): 18-24, 70. doi: 10.12338/j.issn.2096-9015.2024.0148 |
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