Measurement and Analysis of Graphene Layers Based on Raman Spectroscopy

LV Qingbin; LIANG Junmei; ZHAO Haibo; ZHAO Xiaoning; LIU Ran; WANG Bingyue

doi:10.12338/j.issn.2096-9015.2024.0218

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Article Navigation > Metrology Science and Technology > 2024 > Accepted Manuscript

LV Qingbin, LIANG Junmei, ZHAO Haibo, ZHAO Xiaoning, LIU Ran, WANG Bingyue. Measurement and Analysis of Graphene Layers Based on Raman Spectroscopy[J]. Metrology Science and Technology. doi: 10.12338/j.issn.2096-9015.2024.0218

Citation:

LV Qingbin, LIANG Junmei, ZHAO Haibo, ZHAO Xiaoning, LIU Ran, WANG Bingyue. Measurement and Analysis of Graphene Layers Based on Raman Spectroscopy[J]. Metrology Science and Technology. doi: 10.12338/j.issn.2096-9015.2024.0218

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Measurement and Analysis of Graphene Layers Based on Raman Spectroscopy

doi: 10.12338/j.issn.2096-9015.2024.0218

Beijing Institute of Metrology, Beijing, 100029, China

Received Date: 2024-06-30
Accepted Date: 2024-08-13
Rev Recd Date: 2024-07-29

Available Online: 2024-09-11

Abstract

Abstract

Graphene material layer control is one of the important indicators to achieve high-quality development of graphene. Accurately measuring the number of layers is the core for the research, development and application of graphene materials, and analyzing the number of layers for graphene materials has a significant impact on their product performance and applications., the necessity of graphene layer number measurement is first described, and then several existing methods for measuring graphene layers are summarized, including optical contrast method, Raman spectroscopy, atomic force microscopy, and high-resolution transmission electron microscopy. The number of layers of graphene samples prepared by mechanical exfoliation method is measured and analyzed based on Raman spectroscopy . Meanwhile, the randomly selected graphene samples are measured using Raman spectroscopy. By selecting the testing conditions, the signal value of Raman mode peak for blank substrate silicon is higher than 5000. Under the testing method, the characteristic peaks of silicon Raman modes containing graphene samples are measured, we also calculate the ratio of Raman peak heights between graphene containing samples and blank substrates. Compare this ratio with the theoretical value measured by Raman spectroscopy in the national standard to determine the number of layers for graphene samples. The test results show that the developed technique can measure the layer number of graphene film samples prepared by mechanical stripping method, and further provide a reference for detection analysis of the layer number of graphene materials.
- metrology,
- Raman spectroscopy,
- graphene,
- number of layers,
- mechanical exfoliation

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References(37)

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