Abstract: Multi-sensor Coordinate Measuring Machines (CMM) are becoming increasingly crucial in complex object measurements within advanced manufacturing, leveraging the combination of different sensor types to rapidly acquire comprehensive and accurate data. Calibration of multi-sensor CMMs necessitates consideration of individual sensors' metrological characteristics and their collective features. This paper reviews relevant domestic and international methods and discusses research conducted by the National Institute of Metrology of China. The institute has explored applications in photogrammetric targets and hardness indenter parameters using multi-sensor coordinate technology, developed an optical-mechanical dual-purpose standard, and evaluated the accuracy of combined measurement systems integrating image and contact sensors. Finally, the paper identifies several unresolved issues in multi-sensor coordinate measurement technology.