毫米波频段材料介电特性计量研究

郭闻; 徐浩; 梁伟军; 刘科; 贾超; 高秋来

doi:10.12338/j.issn.2096-9015.2020.9020

毫米波频段材料介电特性计量研究

doi: 10.12338/j.issn.2096-9015.2020.9020

中国计量科学研究院，北京 100029

基金项目: 国家自然科学基金青年基金资助项目(11802300)；国家科技部重点研发计划项目(2017YFF0204704)

详细信息

作者简介:
郭闻(1997-)，中国计量科学研究院硕士研究生，研究方向：材料高频电磁参数计量，邮箱：guowen@nim.ac.cn

通讯作者:
徐浩(1990-)，中国计量科学研究院副研究员，研究方向：材料高频电磁参数计量，邮箱：xuhao@nim.ac.cn

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出版历程
- 网络出版日期: 2021-05-28

Measurement of Dielectric Properties of Materials in Millimeter-Wave Frequency Range

National Institute of Metrology, Beijing 100029, China

摘要

摘要: 系统地开展了毫米波频段材料复介电常数的测量方法研究。基于自由空间法采用两步校准方法和时域选通技术，实现了75～110 GHz宽频范围内材料介电特性的测量表征，并基于准光Fabry-Perot谐振原理，研制具有高品质因数的开放式谐振腔，利用高斯波束理论建立了材料介电特性的反演模型，尤其适用于低损耗介质材料的准确测量。通过对比聚氯乙烯(PVC)与熔融石英材料的测量结果，验证了两种测量方法的一致性。此外，针对多层材料提出了去嵌入测量算法，实现了液晶材料各向异性介电常数的表征。
- 毫米波 /
- 复介电常数 /
- 自由空间法 /
- 准光 /
- 开放谐振腔
Abstract: This paper systematically studied the measurement method of complex permittivity of materials in the millimeter-wave frequency range. Based on the free space-method, a two-tier calibration and the time-domain gating technology were proposed to characterize the dielectric property of materials in the broad frequency range of 75～110 GHz, and an open resonant cavity with a high-quality factor is developed based on the quasi-optical Fabry-Perot resonance principle. An inverse model of the dielectric properties of materials is developed using Gaussian beam theory, which is particularly suitable for the accurate measurement of low-loss dielectric materials. By comparing the measurement results of polyvinyl chloride (PVC) and fused quartz, the consistency of these two methods was verified. In addition, we proposed a de-embedding algorithm for multilayer materials, which can characterize the anisotropic dielectric properties for liquid crystals. The Gaussian beam theory was used to establish an inversion model for extracting the complex permittivity, which was especially suitable for the accurate measurement of low-loss materials.
- millimeter wave /
- complex permittivity /
- free-space method /
- quasi-optical /
- open resonant cavity

HTML全文

图 1 自由空间法实验装置示意图

Figure 1. Scheme of the measurement setup for the free-space method

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图 2 自由空间法测量结果

Figure 2. Measurement results of the free-space method

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图 3 准光开放式谐振腔法实验装置示意图

Figure 3. Scheme of the measurement setup for the quasi-optical open resonant cavity method

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图 4 两种方法的测试结果比对

Figure 4. Comparison of the measurement results between the two methods

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图 5 定向排列的液晶样品与在电场下测量示意图

Figure 5. Scheme of oriented liquid crystal sample with measurements under electric field

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图 6 液晶样品垂直介电常数($ {\varepsilon }_{{\rm{r}}\perp } $)与平行介电常数($ {\varepsilon }_{{\rm{r}}\parallel } $)

Figure 6. The perpendicular ($ {\varepsilon }_{{\rm{r}}\perp } $) and parallel ($ {\varepsilon }_{{\rm{r}}\parallel } $) permittivity of LC

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