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Overview of Research and Development of Large-Scale Advanced Metrology Technology
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摘要: 大尺寸计量技术是高精度测量或标定大尺寸物体长度、位置姿态和形貌参量的关键技术，在工业制造、大型建造和工业测量等领域具有广泛的应用。伴随先进光学技术、精密测量技术、数据融合技术和工程应用技术的逐步发展，大尺寸计量技术同样从技术和应用层面均面临不断革新，诞生一系列大尺寸先进计量新技术，打破传统大尺寸计量中单一量值和离线溯源的瓶颈，逐步向复合参量和原位溯源进行过渡，进一步向实现数字化、扁平化和智能化的高精度大尺寸计量变革。通过介绍大尺寸计量中室内工业测量和室外大地测量中的先进计量技术，为大尺寸计量未来的发展趋势进行了展望和分析，并为先进大尺寸计量技术的进一步发展提供了新思路。Abstract: Large-scale metrology technology is crucial for high-precision measurement or calibration of large-sized objects' length, positional attitude, and shape parameters. Its applications span across industrial manufacturing, large-scale construction, and industrial measurement fields. This field is evolving with the progressive development of advanced optical technology, precision measurement techniques, data fusion technology, and engineering application technology. As a result, large-scale metrology technology is undergoing continuous innovation, leading to new advanced metrology techniques. These breakthroughs overcome the traditional constraints of single-value measurements and offline traceability in large-scale metrology, shifting towards composite parameters and in-situ traceability. This transition is part of a broader move towards digitalization, streamlining, and intelligent transformation in high-precision large-scale metrology. The article provides an overview of advanced measurement techniques in indoor industrial measurement and outdoor geodetic measurement within large-scale metrology. It offers insights into future development trends and presents new ideas for the advancement of large-scale metrology technology.
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图 1 双色调制波相位测距原理样机（法国CNAM）
Figure 1. Principle prototype of two-color modulated wave phase ranging（CNAM，French）
图 2 基于紧凑型FPGA的正交锁相放大鉴相系统
Figure 2. Orthogonal phase-locked amplification phase measurement system based on compact FPGA
图 3 全站仪自动测频装置与测尺频率随温度变化实验
Figure 3. Experiment on automatic frequency measuring device and ruler frequency variation with temperature in total stations
图 4 基于空间光路集成的双光梳异步光学采样绝对测距装置
Figure 4. Dual-comb asynchronous optical sampling absolute ranging device based on spatial optical path integration
图 5 双光梳自由运转时，在不同干涉光谱带宽下两小时的干涉光谱状态[36]
Figure 5. Interferometric spectrum state over two hours under different spectral bandwidths with dual combs in free-running mode
图 7 多台跟踪仪动态位姿测量
Figure 7. Dynamic positional measurement with multiple tracking devices
图 8 基于多边法的坐标测量原理
Figure 8. Coordinate measurement principle based on the multilateral method
图 10 中国计量科学研究院昌平基线场
Figure 10. Changping baseline field at the NationalInstitute of Metrology of China
图 11 环境参数自动测量系统传感器布局图
Figure 11. Sensor layout of the automatic environmental parameter measurement system
图 12 高精度绝对测距仪基线测量
Figure 12. High-precision absolute rangefinder baseline measurement using μ-base
图 13 德国PTB多波长测长仪TeleYAG-II
Figure 13. Multi-wavelength interferometer TeleYAG-II at PTB, Germany
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