Overview of Research and Development of Large-Scale Advanced Metrology Technology

LI Jianshuang; MIAO Dongjing; LIU Yang; HE Mingzhao; LI Lianfu; JIANG Yuanlin; KANG Yao; WANG Deli; ZHU Jiaxiang

doi:10.12338/j.issn.2096-9015.2023.0236

Volume 68 Issue 2

Feb. 2024

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Article Navigation > Metrology Science and Technology > 2024 > 68(2): 30-39

LI Jianshuang, MIAO Dongjing, LIU Yang, HE Mingzhao, LI Lianfu, JIANG Yuanlin, KANG Yao, WANG Deli, ZHU Jiaxiang. Overview of Research and Development of Large-Scale Advanced Metrology Technology[J]. Metrology Science and Technology, 2024, 68(2): 30-39. doi: 10.12338/j.issn.2096-9015.2023.0236

Citation:

LI Jianshuang, MIAO Dongjing, LIU Yang, HE Mingzhao, LI Lianfu, JIANG Yuanlin, KANG Yao, WANG Deli, ZHU Jiaxiang. Overview of Research and Development of Large-Scale Advanced Metrology Technology[J]. Metrology Science and Technology, 2024, 68(2): 30-39. doi: 10.12338/j.issn.2096-9015.2023.0236

Citation:

LI Jianshuang, MIAO Dongjing, LIU Yang, HE Mingzhao, LI Lianfu, JIANG Yuanlin, KANG Yao, WANG Deli, ZHU Jiaxiang. Overview of Research and Development of Large-Scale Advanced Metrology Technology[J]. Metrology Science and Technology, 2024, 68(2): 30-39. doi: 10.12338/j.issn.2096-9015.2023.0236

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Overview of Research and Development of Large-Scale Advanced Metrology Technology

doi: 10.12338/j.issn.2096-9015.2023.0236

1.
National Institute of Metrology, Beijing 100029, China
2.
Xi’an University of Technology, Xi’an 710048, China

Received Date: 2023-10-20
Accepted Date: 2023-11-16
Rev Recd Date: 2023-12-10

Available Online: 2023-12-21

Publish Date: 2024-02-18

Abstract

Abstract

Large-scale metrology technology is crucial for high-precision measurement or calibration of large-sized objects' length, positional attitude, and shape parameters. Its applications span across industrial manufacturing, large-scale construction, and industrial measurement fields. This field is evolving with the progressive development of advanced optical technology, precision measurement techniques, data fusion technology, and engineering application technology. As a result, large-scale metrology technology is undergoing continuous innovation, leading to new advanced metrology techniques. These breakthroughs overcome the traditional constraints of single-value measurements and offline traceability in large-scale metrology, shifting towards composite parameters and in-situ traceability. This transition is part of a broader move towards digitalization, streamlining, and intelligent transformation in high-precision large-scale metrology. The article provides an overview of advanced measurement techniques in indoor industrial measurement and outdoor geodetic measurement within large-scale metrology. It offers insights into future development trends and presents new ideas for the advancement of large-scale metrology technology.
- metrology,
- large-scale metrology,
- industrial metrology,
- geodetic metrology,
- quantity traceability,
- composite parameters,
- digitalization

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References(51)

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