ZHENG Chundi, LI Tianshuo, FENG Guojin, GAN Haiyong, WU Houping, PAN Jiangen, HE Yingwei. Development of a Device for Measuring and Calibrating Spectral Retroreflection Standards[J]. Metrology Science and Technology. DOI: 10.12338/j.issn.2096-9015.2025.0071
    Citation: ZHENG Chundi, LI Tianshuo, FENG Guojin, GAN Haiyong, WU Houping, PAN Jiangen, HE Yingwei. Development of a Device for Measuring and Calibrating Spectral Retroreflection Standards[J]. Metrology Science and Technology. DOI: 10.12338/j.issn.2096-9015.2025.0071

    Development of a Device for Measuring and Calibrating Spectral Retroreflection Standards

    • This article reports on the research and establishment of a spectral retroreflection standard measurement and calibration apparatus. Based on the physical definition and measurement principles of spectral retroreflection standards, the calibration device was constructed and implemented through precise optical path design integrating a stable light source and a fiber-optic imaging spectrometer. This device provides stable and reliable measurement results within the spectral range of 380nm to 780nm and under key retroreflection measurement geometric conditions (incidence angle: −4° to 30°, observation angle: 0.2° to 1°). Experiments demonstrate that the device exhibits good performance in terms of measurement accuracy and consistency. Verification experiments were conducted using the national retroreflection coefficient measurement calibration apparatus, with the optimal consistency measurement result for the same sample under typical conditions being 0.1%. This work has positive implications for the continued promotion of retroreflective materials in important fields such as traffic safety.
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