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    The Development of New Primary Standard for Positional Angles
    HUANG Yao, XUE Zi, WU Jinjie, CHE Shuangliang
    2024, 68(2): 3-9. DOI: 10.12338/j.issn.2096-9015.2023.0299
    Abstract PDF
    Development of a 22 Nano Line Width Standard Based on Intrinsic SiliconLattice Constants
    WANG Fang, SHI Yushu, ZHANG Shu
    2024, 68(2): 10-15, 59. DOI: 10.12338/j.issn.2096-9015.2023.0150
    Abstract PDF
    Methodology and Technology for Ultra-Precise Rotary Axes Motion Error Measurement
    NI He, SUN Houjun, ZHU Kaiqiang, DONG Xianping, GAO Shoufeng, AN Dongyang
    2024, 68(2): 16-29. DOI: 10.12338/j.issn.2096-9015.2023.0315
    Abstract PDF
    Overview of Research and Development of Large-Scale Advanced Metrology Technology
    LI Jianshuang, MIAO Dongjing, LIU Yang, HE Mingzhao, LI Lianfu, JIANG Yuanlin, KANG Yao, WANG Deli, ZHU Jiaxiang
    2024, 68(2): 30-39. DOI: 10.12338/j.issn.2096-9015.2023.0236
    Abstract PDF
    Study on Ultra-Precision Displacement Measurement Technique Based on a Single-Path Littrow Grating Interferometer
    ZHU Hongyu, WU Yize, FENG Jingtong, LIN Zichao, YU Jing, XUE Dongbai, DENG Xiao, CHENG Xinbin
    2024, 68(2): 40-45, 75. DOI: 10.12338/j.issn.2096-9015.2023.0304
    Abstract PDF
    Calibration and Applications of Multi-Sensor Coordinate Measuring Machines
    WEI Hengzheng, WANG Weinong, PEI Limei, GUO Siyi, CUI Jianqiu, XIANG Sisi
    2024, 68(2): 46-51. DOI: 10.12338/j.issn.2096-9015.2023.0289
    Abstract PDF
    Development and Metrological Techniques of Nano-Step Height Reference Materials Based on Laser Traceability
    WANG Chenying, JING Weixuan, ZHANG Yaxin, LI Wei, ZHANG Yijun, LI Changsheng, SHI Yushu, JIANG Zhuangde
    2024, 68(2): 52-59. DOI: 10.12338/j.issn.2096-9015.2023.0149
    Abstract PDF
    Research on Key Common Metrological Technologies for Intelligent Manufacturing of Large-Scale Equipment
    ZHAO Ziyue, GONG Siyuan, QU Jiansu, HE Xiaomei, WANG Aijun, WANG Yizhang, LI Yan, HE Xuejun
    2024, 68(2): 60-75. DOI: 10.12338/j.issn.2096-9015.2023.0286
    Abstract PDF
    Overview of the Development of Near-Field Optical Microscopy
    TAO Weihao, ZHAO Shuhao, DONG Hanjin, ZHANG Guofeng, YANG Shuming
    2024, 68(2): 76-87. DOI: 10.12338/j.issn.2096-9015.2023.0363
    Abstract PDF
    End Standards Measurement
    ZHANG Xudong, WANG Fangbiao, WEN Zitong, GAO Hongtang, LIU Xiangbin
    2024, 68(2): 88-94. DOI: 10.12338/j.issn.2096-9015.2023.0233
    Abstract PDF
    Review on 633 nm Iodine-Stabilized Helium-Neon Lasers
    ZOU Jinpeng, YIN Cong, WANG Jianbo, BI Wenwen, ZHANG Mingyu, ZHU Yixuan
    2024, 68(2): 95-100, 9. DOI: 10.12338/j.issn.2096-9015.2023.0283
    Abstract PDF
    Advances and Applications in High-Precision Surface Coordinate Measurement Methods
    DIAO Xiaofei, FAN Xinrui, KANG Yanhui
    2024, 68(2): 101-110. DOI: 10.12338/j.issn.2096-9015.2023.0339
    Abstract PDF